
基于专利计量的科学密集型技术研发特征研究
逯万辉
基于专利计量的科学密集型技术研发特征研究
Research on the R&D Characteristics of Science Intensive Technology Based on Patentometrics#br#
{{custom_ref.label}} |
{{custom_citation.content}}
{{custom_citation.annotation}}
|
/
〈 |
|
〉 |